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Timothy Schuler
Timothy Schuler
Professor of Practice, Tulane University
Dirección de correo verificada de tulane.edu
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Character of the insulating state in NiO: A mixture of charge-transfer and Mott-Hubbard character
TM Schuler, DL Ederer, S Itza-Ortiz, GT Woods, TA Callcott, JC Woicik
Physical Review B 71 (11), 115113, 2005
1042005
Calculated half-metallic behavior in dilute magnetically doped ZnS
RA Stern, TM Schuler, JM MacLaren, DL Ederer, V Perez-Dieste, ...
Journal of applied physics 95 (11), 7468-7470, 2004
622004
Systematic trends of first-principles electronic structure computations of Zn 1− x A x B diluted magnetic semiconductors
RD McNorton, TM Schuler, JM MacLaren, RA Stern
Physical Review B 78 (7), 075209, 2008
612008
Prosthetic devices
DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter
US Patent 9,144,628, 2015
222015
Prosthetic devices
DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter
US Patent 9,144,628, 2015
222015
Prosthetic devices
DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter
US Patent 9,144,628, 2015
222015
Image-plate sensitivity to x rays at 2 to 60 keV
MJ Rosenberg, DB Thorn, N Izumi, D Williams, M Rowland, G Torres, ...
Review of Scientific Instruments 90 (1), 2019
182019
Electronic structure of the dilute magnetic semiconductor Zn 0.90 Mn 0.10 S obtained by soft x-ray spectroscopy and first-principles calculations
TM Schuler, RA Stern, R McNorton, SD Willoughby, JM MacLaren, ...
Physical Review B 72 (4), 045211, 2005
142005
Electronic structure of the dilute magnetic semiconductor Zn 0.90 Mn 0.10 S obtained by soft x-ray spectroscopy and first-principles calculations
TM Schuler, RA Stern, R McNorton, SD Willoughby, JM MacLaren, ...
Physical Review B 72 (4), 045211, 2005
142005
Chemical effects in the manganese x-ray emission that follows resonant and nonresonant photon production of a hole
J Jiménez-Mier, DL Ederer, T Schuler
Physical Review B 70 (3), 035216, 2004
142004
Polyarylene Composition and Articles Made Therefrom
DB Thomas, N Maljkovic, T Schuler, TS Rushing, RL Carter
US Patent App. 12/281,023, 2009
102009
X-ray Raman scattering at the manganese L edge of Mn F 2: Valence emission of Mn 2+
J Jiménez-Mier, DL Ederer, T Schuler
Physical Review A 72 (5), 052502, 2005
92005
Direct evidence for 3p→ 2p non-dipole x-ray emission in transition metals
J Jiménez-Mier, DL Ederer, T Schuler, TA Callcott
Journal of Physics B: Atomic, Molecular and Optical Physics 36 (11), L173, 2003
82003
Ligand field and interference effects in L-edge x-ray Raman scattering of MnF2 and CoF2
J Jiménez-Mier, GM Herrera-Pérez, P Olalde-Velasco, DL Ederer, ...
Revista mexicana de física 54, 30-35, 2008
72008
Correlation effects in the resonant and nonresonant manganese photon emission in
J Jiménez-Mier, DL Ederer, T Schuler
Physical Review A 68 (4), 042715, 2003
72003
Electronic structure of transition metal fluorides and oxides determined by resonant X-ray absorption and X-ray emission spectroscopies
J Jiménez-Mier, GM Herrera-Pérez, P Olalde-Velasco, E Chavira, ...
Radiation Effects & Defects in Solids 162 (7-8), 613-620, 2007
52007
X-ray Raman scattering at the L edge of manganese compounds: Characteristic behaviour of Mn2+ and Mn3+
J Jiménez-Mier, DL Ederer, T Schuler
Radiation Physics and Chemistry 75 (11), 1666-1669, 2006
42006
Prosthetic devices
DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter
US Patent 8,592,531, 2013
32013
Diffusion of TiN into aluminum films measured by soft X-ray spectroscopy and Rutherford backscattering spectroscopy
TM Schuler, DL Ederer, N Ruzycki, G Glass, WA Hollerman, A Moewes, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (5 …, 2001
32001
Erratum:“Image-plate sensitivity to x rays at 2 to 60 keV”[Rev. Sci. Instrum. 90, 013506 (2019)]
MJ Rosenberg, DB Thorn, N Izumi, D Williams, M Rowland, G Torres, ...
Review of Scientific Instruments 90 (2), 2019
22019
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