Follow
Clément Fallet
Clément Fallet
Clement Fallet Consulting
Verified email at polytechnique.edu
Title
Cited by
Cited by
Year
Polarimetric imaging of uterine cervix: a case study
A Pierangelo, A Nazac, A Benali, P Validire, H Cohen, T Novikova, ...
Optics express 21 (12), 14120-14130, 2013
2832013
Multispectral Mueller polarimetric imaging detecting residual cancer and cancer regression after neoadjuvant treatment for colorectal carcinomas
A Pierangelo, S Manhas, A Benali, C Fallet, JL Totobenazara, ...
Journal of biomedical optics 18 (4), 046014-046014, 2013
2122013
Ex vivo photometric and polarimetric multilayer characterization of human healthy colon by multispectral Mueller imaging
A Pierangelo, S Manhas, A Benali, C Fallet, MR Antonelli, T Novikova, ...
Journal of biomedical optics 17 (6), 066009-066009, 2012
702012
Overlay measurements by Mueller polarimetry in back focal plane
C Fallet, T Novikova, M Foldyna, S Manhas, BH Ibrahim, A De Martino, ...
Journal of Micro/Nanolithography, MEMS, and MOEMS 10 (3), 033017, 2011
422011
Conical diffraction illumination opens the way for low phototoxicity super-resolution imaging
J Caron, C Fallet, JY Tinevez, L Moisan, LP Braitbart, GY Sirat, SL Shorte
Cell adhesion & migration 8 (5), 430-439, 2014
402014
Sum decomposition of Mueller-matrix images and spectra of beetle cuticles
H Arwin, R Magnusson, E Garcia-Caurel, C Fallet, K Järrendahl, ...
Optics express 23 (3), 1951-1966, 2015
272015
Experimental evidence for naturally occurring nondiagonal depolarizers
R Ossikovski, M Foldyna, C Fallet, A De Martino
Optics letters 34 (16), 2426-2428, 2009
252009
Experimental validation of the symmetric decomposition of Mueller matrices
C Fallet, A Pierangelo, R Ossikovski, A De Martino
Optics express 18 (2), 831-842, 2010
202010
Optical measuring device and process
GY Sirat, L Moisan, C Fallet, J Caron, M Dubois
US Patent 10,921,255, 2021
192021
Experimental implementation and properties of Stokes nondiagonalizable depolarizing Mueller matrices
R Ossikovski, C Fallet, A Pierangelo, A De Martino
Optics letters 34 (7), 974-976, 2009
192009
Polarimétrie de Mueller résolue angulairement et applications aux structures périodiques
C Fallet
Doctor of Philosophy Thesis]. Palaiseau, France: Ecole Polytechnique, 2011
17*2011
Achromatization of conical diffraction: application to the generation of a polychromatic optical vortex
C Fallet, GY Sirat
Optics Letters 41 (4), 769-772, 2016
142016
Conical diffraction as a versatile building block to implement new imaging modalities for superresolution in fluorescence microscopy
C Fallet, J Caron, S Oddos, JY Tinevez, L Moisan, GY Sirat, PO Braitbart, ...
Nanoimaging and Nanospectroscopy II 9169, 9-14, 2014
122014
Necessary steps for the systematic calibration of a multispectral imaging system to achieve a targetless workflow in reflectance estimation: A study of Parrot SEQUOIA for …
LM Domenzain, C Fallet
Algorithms and Technologies for Multispectral, Hyperspectral, and …, 2018
62018
Applications of Mueller polarimetry in the Fourier space for overlay characterization in microelectronics
C Fallet, S Manhas, A de Martino, T Novikova
Instrumentation, Metrology, and Standards for Nanomanufacturing IV 7767, 110-119, 2010
62010
A new method to achieve tens of nm axial super-localization based on conical diffraction PSF shaping
C Fallet, M Dubois, JY Tinevez, S Oddos, J Caron, R Persson, SL Shorte, ...
Single Molecule Spectroscopy and Superresolution Imaging VIII 9331, 65-75, 2015
52015
Correction of in-flight luminosity variations in multispectral UAS images, using a luminosity sensor and camera pair for improved biomass estimation in precision agriculture
JM Gilliot, J Michelin, R Faroux, LM Domenzain, C Fallet
Autonomous Air and Ground Sensing Systems for Agricultural Optimization and …, 2018
42018
Overlay measurements by Mueller polarimetry in the back focal plane
T Novikova, C Fallet, M Foldyna, S Manhas, BH Ibrahim, A De Martino, ...
Metrology, Inspection, and Process Control for Microlithography XXV 7971 …, 2011
32011
Analysis of textured films and periodic grating structures with Mueller matrices: A new challenge in instrumentation with the generation of angle-resolved SE polarimeters
F Ferrieu, T Novikova, C Fallet, SB Hatit, C Vannuffel, A De Martino
Thin solid films 519 (9), 2608-2612, 2011
32011
Optical measuring device and process
GY Sirat, L Moisan
US Patent 11,921,042, 2024
12024
The system can't perform the operation now. Try again later.
Articles 1–20