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Julie Gonnissen
Julie Gonnissen
Doctor in Physics (EMAT), University of Antwerp
Dirección de correo verificada de uantwerpen.be
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Año
Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall‐Meanders, Kinks, and Local Electric Charges
J Gonnissen, D Batuk, GF Nataf, L Jones, AM Abakumov, S Van Aert, ...
Advanced Functional Materials 26 (42), 7599-7604, 2016
832016
Thickness dependent properties in oxide heterostructures driven by structurally induced metal–oxygen hybridization variations
Z Liao, N Gauquelin, RJ Green, S Macke, J Gonnissen, S Thomas, ...
Advanced functional materials 27 (17), 1606717, 2017
782017
Estimation of unknown structure parameters from high-resolution (S) TEM images: what are the limits?
AJ Den Dekker, J Gonnissen, A De Backer, J Sijbers, S Van Aert
Ultramicroscopy 134, 34-43, 2013
532013
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
A De Backer, J Gonnissen, S Van Aert
Ultramicroscopy 151, 46-55, 2015
442015
Long‐Range Domain Structure and Symmetry Engineering by Interfacial Oxygen Octahedral Coupling at Heterostructure Interface
Z Liao, RJ Green, N Gauquelin, S Macke, L Li, J Gonnissen, R Sutarto, ...
Advanced Functional Materials 26 (36), 6627-6634, 2016
342016
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images
J Gonnissen, A De Backer, AJ Den Dekker, GT Martinez, A Rosenauer, ...
Applied Physics Letters 105 (6), 2014
342014
Direct space structure solution from precession electron diffraction data: Resolving heavy and light scatterers in Pb13Mn9O25
J Hadermann, AM Abakumov, AA Tsirlin, VP Filonenko, J Gonnissen, ...
Ultramicroscopy 110 (7), 881-890, 2010
292010
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design
J Gonnissen, A De Backer, AJ Den Dekker, J Sijbers, S Van Aert
Ultramicroscopy 170, 128-138, 2016
132016
Atom-counting in high resolution electron microscopy: TEM or STEM–That's the question
J Gonnissen, A De Backer, AJ den Dekker, J Sijbers, S Van Aert
Ultramicroscopy 174, 112-120, 2017
102017
Optimal statistical experiment design for detecting and locating light atoms using quantitative high resolution (scanning) transmission electron microscopy
J Gonnissen
University of Antwerp, 2017
2017
Optimal detectability combined with picometre range precision to position light atoms from HR STEM images
J Gonnissen, A De Backer, A Jan den Dekker, J Sijbers, S Van Aert
European Microscopy Congress 2016: Proceedings, 549-550, 2016
2016
Engineering properties by long range symmetry propagation initiated at perovskite heterostructure interface
ZL Liao, RJ Green, N Gauquelin, J Gonnissen, S Van Aert, J Verbeeck
Advanced functional materials.-Weinheim, 1-25, 2016
2016
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?
A De Backer, A De Wael, J Gonnissen, GT Martinez, A Béché, ...
Journal of Physics: Conference Series 644 (1), 012034, 2015
2015
Analysis of magnetic structures using magnetic superspace groups vs. representation analysis
J Gonnissen
UNIVERSITEIT ANTWERPEN, 2012
2012
Atomic number estimation from STEM images: what are the limits?
J Gonnissen, AJ den Dekker, A De Backer, J Sijbers, S Van Aert
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Artículos 1–15