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Aysel Buyukbas Ulusan
Aysel Buyukbas Ulusan
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On the conduction mechanisms of Au/(Cu2O–CuO–PVA)/n-Si (MPS) Schottky barrier diodes (SBDs) using current–voltage–temperature (I–V–T) characteristics
A Büyükbaş Uluşan, A Tataroğlu, Y Azizian-Kalandaragh, Ş Altındal
Journal of Materials Science: Materials in Electronics 29, 159-170, 2018
902018
A comparative study on the electrical and dielectric properties of Al/Cd-doped ZnO/p-Si structures
A Buyukbas-Ulusan, İ Taşcıoğlu, A Tataroğlu, F Yakuphanoğlu, S Altındal
Journal of Materials Science: Materials in Electronics 30, 12122-12129, 2019
532019
Electrical and impedance properties of MPS structure based on (Cu2O–CuO–PVA) interfacial layer
A Buyukbas-Uluşan, SA Yerişkin, A Tataroğlu, M Balbaşı, ...
Journal of Materials Science: Materials in Electronics 29, 8234-8243, 2018
512018
Analysis of interface states in Au/ZnO/p-InP (MOS) structure
FZ Acar, A Buyukbas-Ulusan, A Tataroglu
Journal of Materials Science: Materials in Electronics 29, 12553-12560, 2018
432018
Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure
AB Uluşan, A Tataroğlu
Silicon 10, 2071-2077, 2018
362018
Forward and reverse bias current–voltage (I–V) characteristics in the metal–ferroelectric–semiconductor (Au/SrTiO3/n-Si) structures at room temperature
A Buyukbas-Ulusan, S Altındal-Yerişkin, A Tataroğlu
Journal of Materials Science: Materials in Electronics 29 (19), 16740-16746, 2018
342018
Photoresponse characteristics of Au/(CoFe2O4-PVP)/n-Si/Au (MPS) diode
AB Ulusan, A Tataroglu, Ş Altındal, Y Azizian-Kalandaragh
Journal of Materials Science: Materials in Electronics 32 (12), 15732-15739, 2021
332021
A Compare Study on Electrical Properties of MS Diodes with and Without CoFe2O4-PVP Interlayer
A Tataroglu, A Buyukbas Ulusan, Ş Altındal, Y Azizian-Kalandaragh
Journal of Inorganic and Organometallic Polymers and Materials 31, 1668-1675, 2021
252021
Double-exponential current–voltage (I–V) and negative capacitance (NC) behavior of Al/(CdSe-PVA)/p-Si/Al (MPS) structure
A Büyükbaş-Uluşan, A Tataroğlu, Y Azizian-Kalandaragh, M Koşal
Journal of Materials Science: Materials in Electronics 30, 9572-9581, 2019
232019
Electrical characterization of MIS diode prepared by magnetron sputtering
H Tanrıkulu, A Tataroğlu, EE Tanrıkulu, AB Uluşan
NISCAIR-CSIR, India, 2018
222018
Electrical characterization of silicon nitride interlayer-based MIS diode
A Buyukbas-Ulusan, A Tataroglu
Journal of Materials Science: Materials in Electronics 31, 9888-9893, 2020
172020
Analysis of barrier inhomogeneities in AuGe/n-Ge Schottky diode
A Buyukbas Ulusan, A Tataroglu
Indian Journal of Physics 92, 1397-1402, 2018
162018
Analysis of barrier height and carrier concentration of MOS capacitor using Cf and G/ω-f measurements
A Tataroğlu, G Güven, S Yılmaz, A Büyükbaş
Gazi University Journal of Science 27 (3), 909-915, 2014
152014
Impedance spectroscopy of Au/TiO2/n-Si metal-insulator-semiconductor (MIS) capacitor
A Büyükbaş-Uluşan, A Tataroğlu
Physica B: Condensed Matter 580, 411945, 2020
142020
Analysis of Electrical Characteristics of Metal-Oxide-Semiconductor Capacitor by Impedance Spectroscopy
A Buyukbas, A Tataroğlu, M Balbaşı
Journal of Nanoelectronics and Optoelectronics 9 (4), 515-519, 2014
102014
Analysis of the Current Transport Characteristics (CTCs) in the Au/n-Si Schottky diodes (SDs) with Al2O3 interfacial layer over wide temperature range
A Buyukbas-Ulusan, A Tataroglu, S Altındal-Yerişkin
ECS Journal of Solid State Science and Technology 12 (8), 083010, 2023
82023
Effects of temperature on dielectric parameters of metal-oxide-semiconductor capacitor with thermal oxide layer
A Büyükbaş, A Tataroğlu
Journal of Nanoelectronics and Optoelectronics 10 (5), 675-679, 2015
82015
Dielectric, conductivity and modulus analysis of AuGe/SiO 2/p-Si/AuGe capacitor
A Büyükbaş, A Tataroglu, M Balbasi
J. Optoelectron. Adv. Mater 17, 1134-1138, 2015
52015
Ionizing radiation effects on Au/TiO2/n-Si metal–insulator-semiconductor (MIS) structure
R Ertugrul-Uyar, A Buyukbas-Ulusan, A Tataroglu
Journal of Materials Science: Materials in Electronics 31, 19846-19851, 2020
32020
Dielectric, ac conductivity and electric modulus studies at MPS structure with (Cu2O-CuO)-doped PVA interfacial layer
A Büyükbaş-Uluşan, SA Yerişkin, A Tataroğlu, M Balbasi, ...
Optoelectronics and Advanced Materials-Rapid Communications 14 (May-June …, 2020
32020
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