Seguir
Javier Diaz-Fortuny
Javier Diaz-Fortuny
Dirección de correo verificada de imec.be
Título
Citado por
Citado por
Año
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI
MN Javier Diaz-Fortuny, Javier Martin-Martinez, Rosana Rodriguez, Rafael ...
IEEE Journal of Solid-State Circuits, 1-13, 2018
38*2018
Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages
M Maestro, J Martin-Martinez, J Diaz, A Crespo-Yepes, MB Gonzalez, ...
Microelectronic Engineering 147, 176-179, 2015
272015
Flexible setup for the measurement of CMOS time-dependent variability with array-based integrated circuits
J Diaz-Fortuny, P Saraza-Canflanca, R Castro-Lopez, E Roca, ...
IEEE Transactions on Instrumentation and Measurement 69 (3), 853-864, 2019
252019
New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM
M Maestro, J Diaz, A Crespo-Yepes, MB Gonzalez, J Martin-Martinez, ...
Solid-State Electronics 115, 140-145, 2016
252016
TARS: A toolbox for statistical reliability modeling of CMOS devices
J Diaz-Fortuny, J Martín-Martínez, R Rodríguez, M Nafria, R Castro-López, ...
2017 14th International Conference on Synthesis, Modeling, Analysis and …, 2017
162017
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging
J Diaz-Fortuny, J Martín-Martínez, R Rodríguez, M Nafria, R Castro-López, ...
2017 14th International Conference on Synthesis, Modeling, Analysis and …, 2017
142017
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ...
Integration 72, 13-20, 2020
122020
A model parameter extraction methodology including time-dependent variability for circuit reliability simulation
J Diaz-Fortuny, P Saraza-Canflanca, A Toro-Frías, R Castro-López, ...
2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018
112018
Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability
VM Van Santen, J Diaz-Fortuny, H Amrouch, J Martin-Martinez, ...
2018 IEEE International Reliability Physics Symposium (IRPS), P-CR. 6-1-P-CR …, 2018
112018
Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS2 Transistor
K Lee, J Choi, B Kaczer, A Grill, JW Lee, S Van Beek, E Bury, ...
Advanced Functional Materials 31 (23), 2100625, 2021
102021
A smart noise-and RTN-removal method for parameter extraction of CMOS aging compact models
J Diaz-Fortuny, J Martin-Martinez, R Rodriguez, R Castro-Lopez, E Roca, ...
Solid-State Electronics 159, 99-105, 2019
82019
Design considerations of an SRAM array for the statistical validation of time-dependent variability models
P Saraza-Canflanca, D Malagon, F Passos, A Toro, J Núñez, ...
2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018
82018
A ring-oscillator-based degradation monitor concept with tamper detection capability
J Diaz-Fortuny, P Saraza-Canflanca, E Bury, M Vandemaele, B Kaczer, ...
2022 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2022
72022
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors
P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ...
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 150-155, 2019
72019
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
J Diaz-Fortuny, P Saraza-Canflanca, R Rodriguez, J Martin-Martinez, ...
Solid-State Electronics 185, 108037, 2021
62021
A new time efficient methodology for the massive characterization of RTN in CMOS devices
G Pedreira, J Martín-Martínez, J Diaz-Fortuny, P Saraza-Canflanca, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019
62019
A noise and RTN-removal smart method for parameters extraction of CMOS aging compact models
J Diaz-Fortuny, J Martin-Martinez, R Rodriguez, M Nafria, R Castro-Lopez, ...
2018 Joint International EUROSOI Workshop and International Conference on …, 2018
62018
TiDeVa: a toolbox for the automated and robust analysis of Time-Dependent Variability at transistor level
P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ...
2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019
52019
Cyclic Thermal Effects on Devices of Two‐Dimensional Layered Semiconducting Materials
Y Kim, B Kaczer, D Verreck, A Grill, D Kim, J Song, J Diaz‐Fortuny, A Vici, ...
Advanced Electronic Materials 7 (9), 2100348, 2021
42021
CMOS characterization and compact modelling for circuit reliability simulation
J Diaz-Fortuny, J Martin-Martinez, R Rodriguez, M Nafria, R Castro-Lopez, ...
2018 IEEE 24th International Symposium on On-Line Testing and Robust System …, 2018
42018
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20