Peter Moeck
Peter Moeck
Professor of Physics, Portland State University
Dirección de correo verificada de pdx.edu - Página principal
TítuloCitado porAño
Crystallography Open Database–an open-access collection of crystal structures
S Gražulis, D Chateigner, RT Downs, AFT Yokochi, M Quirós, L Lutterotti, ...
Journal of applied crystallography 42 (4), 726-729, 2009
5942009
Crystallography Open Database (COD): an open-access collection of crystal structures and platform for world-wide collaboration
S Gražulis, A Daškevič, A Merkys, D Chateigner, L Lutterotti, M Quiros, ...
Nucleic acids research 40 (D1), D420-D427, 2011
4382011
Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
EF Rauch, J Portillo, S Nicolopoulos, D Bultreys, S Rouvimov, P Moeck
Zeitschrift für Kristallographie International journal for structural …, 2010
2092010
High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes
P Moeck, S Rouvimov, EF Rauch, M Véron, H Kirmse, I Häusler, ...
Crystal research and technology 46 (6), 589-606, 2011
1112011
Self-assembled InSb quantum dots grown on GaSb: A photoluminescence, magnetoluminescence, and atomic force microscopy study
E Alphandery, RJ Nicholas, NJ Mason, B Zhang, P Möck, GR Booker
Applied physics letters 74 (14), 2041-2043, 1999
861999
Room-temperature InAsSb strained-layer superlattice light-emitting diodes at with AlSb barriers for improved carrier confinement
MJ Pullin, HR Hardaway, JD Heber, CC Phillips, WT Yuen, RA Stradling, ...
Applied physics letters 74 (16), 2384-2386, 1999
461999
Making sense of nanocrystal lattice fringes
P Fraundorf, W Qin, P Moeck, E Mandell
Journal of Applied Physics 98 (11), 114308, 2005
432005
3D systems' technology overview and new applications in manufacturing, engineering, science, and education
TJ Snyder, M Andrews, M Weislogel, P Moeck, J Stone-Sundberg, ...
3D printing and additive manufacturing 1 (3), 169-176, 2014
422014
Magnetic CdSe-based quantum dots grown on Mn-passivated ZnSe
LV Titova, JK Furdyna, M Dobrowolska, S Lee, T Topuria, P Moeck, ...
Applied physics letters 80 (7), 1237-1239, 2002
362002
Void-mediated formation of Sn quantum dots in a Si matrix
Y Lei, P Möck, T Topuria, ND Browning, R Ragan, KS Min, HA Atwater
Applied physics letters 82 (24), 4262-4264, 2003
342003
Atomic resolution scanning transmission electron microscopy
ND Browning, I Arslan, P Moeck, T Topuria
physica status solidi (b) 227 (1), 229-245, 2001
302001
MOVPE grown self-assembled and self-ordered InSb quantum dots in a GaSb matrix assessed by AFM, CTEM, HRTEM and PL
P Möck, GR Booker, NJ Mason, RJ Nicholas, E Aphandery, T Topuria, ...
Materials Science and Engineering: B 80 (1-3), 112-115, 2001
282001
Topography measurements of the critical thickness of ZnSe grown on GaAs
G Horsburgh, KA Prior, W Meredith, I Galbraith, BC Cavenett, ...
Applied physics letters 72 (24), 3148-3150, 1998
241998
Structural fingerprinting in the transmission electron microscope: Overview and opportunities to implement enhanced strategies for nanocrystal identification
P Moeck, P Fraundorf
Zeitschrift für Kristallographie-Crystalline Materials 222 (11/2007), 634-645, 2007
222007
3D printed models of small and large molecules, structures and morphologies of crystals, as well as their anisotropic physical properties
J Stone‐Sundberg, W Kaminsky, T Snyder, P Moeck
Crystal Research and Technology 50 (6), 432-441, 2015
212015
Enlivening 300 level general education classes on nanoscience and nanotechnology with 3D printed crystallographic models
P Moeck, J Stone-Sundberg, TJ Snyder, W Kaminsky
J. Mater. Edu 36, 77-96, 2014
212014
Self-ordered CdSe quantum dots in ZnSe and (Zn, Mn) Se Matrices Assessed by transmission electron microscopy and photoluminescence spectroscopy
P Möck, T Topuria, ND Browning, L Titova, M Dobrowolska, S Lee, ...
Journal of electronic materials 30 (6), 748-755, 2001
212001
Application of atomic scale STEM techniquesto the study of interfaces and defects in materials
D Browning, I Arslan, Y Ito, M James, F Klie, P Moeck, T Topuria, Y Xin
Microscopy 50 (3), 205-218, 2001
202001
One-click preparation of 3D print files (*. stl,*. wrl) from*. cif (crystallographic information framework) data using Cif2VRML
W Kaminsky, T Snyder, J Stone-Sundberg, P Moeck
Powder Diffraction 29 (S2), S42-S47, 2014
192014
Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope
P Moeck, S Rouvimov
Zeitschrift für Kristallographie International journal for structural …, 2010
192010
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
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