| Novel Low-E filter for architectural glass pane N Abundiz-Cisneros, R Sanginés, R Rodríguez-López, M Peralta-Arriola, ... Energy and Buildings 206, 109558, 2020 | 42 | 2020 |
| Thickness effect on the optical and morphological properties in Al2O3/ZnO nanolaminate thin films prepared by atomic layer deposition J López, J Martínez, N Abundiz, D Domínguez, E Murillo, FF Castillón, ... Superlattices and Microstructures 90, 265-273, 2016 | 33 | 2016 |
| Plasma emission spectroscopy and its relation to the refractive index of silicon nitride thin films deposited by reactive magnetron sputtering R Sanginés, N Abundiz-Cisneros, OH Utrera, C Diliegros-Godines, ... Journal of Physics D: Applied Physics 51 (9), 095203, 2018 | 18 | 2018 |
| Cleaning level of the target before deposition by reactive direct current magnetron sputtering OH Utrera, N Abundiz-Cisneros, R Sanginés, CJ Diliegros-Godines, ... Thin Solid Films 646, 98-104, 2018 | 14 | 2018 |
| TEM and spectroscopic ellipsometry studies of multilayer gate dielectrics containing crystalline and amorphous Si nanoclusters D Mateos, MA Curiel, N Nedev, D Nesheva, R Machorro, E Manolov, ... Physica E: Low-dimensional Systems and Nanostructures 51, 111-114, 2013 | 6 | 2013 |
| Study of deposition parameters of reactive-sputtered Si3N4 thin films by optical emission spectroscopy R Rodríguez-López, G Soto-Valle, R Sanginés, N Abundiz-Cisneros, ... Thin Solid Films 754, 139313, 2022 | 5 | 2022 |
| New ultrathin film heterostructure for low-e application by sputtering technique: a theoretical and experimental study MA Ruiz-Robles, N Abundiz-Cisneros, CE Bender-Pérez, ... Materials Research Express 5 (3), 036420, 2018 | 5 | 2018 |
| Modeling the thickness distribution of silicon oxide thin films grown by reactive magnetron sputtering J Cruz, R Sanginés, N Abundiz-Cisneros, J Aguila-Muñoz, S Muhl, ... Journal of Physics D: Applied Physics 52 (49), 495201, 2019 | 4 | 2019 |
| Non-quarter-wave dielectric mirror prepared by thermal atomic layer deposition J Lopez, H Márquez, H Borbón-Nuñez, N Abundiz, R Machorro, ... Optics & Laser Technology 127, 106143, 2020 | 3 | 2020 |
| Optical spectroscopy and spectroscopic ellipsometry as a monitor for thin film growth by dc magnetron sputtering N Abundiz-Cisneros, A Perez-Garcia, M Gomez-Muñoz, R Machorro Journal of Applied Physics 113 (13), 2013 | 3 | 2013 |
| Optical spectroscopy as a monitor of thin film growth in sputtering N Abundiz, A Perez, V García, R Machorro 22nd Congress of the International Commission for Optics: Light for the …, 2011 | 1 | 2011 |
| Plasma emission spectroscopy and optical properties of reactive-sputtered silicon oxynitride films R Rodriguez Lopez, N Abundiz-Cisneros, R Sangines, J Aguila-Muñoz, ... Journal of Physics D: Applied Physics, 2024 | | 2024 |
| Linear and nonlinear properties study of silicon nitride films for integrated photonics AL Aguayo-Alvarado, FA Araiza-Sixtos, N Abundiz-Cisneros, ... Journal of Non-Crystalline Solids 613, 122370, 2023 | | 2023 |
| Role of different atmosphere gasses during annealing in chemical-solution-deposition NiO thin films processing M Martínez-Gil, D Cabrera-German, M Rodríguez-Curiel, ... Journal of Non-Crystalline Solids 600, 122012, 2023 | | 2023 |
| Synthesis and characterization of Zinc Oxide thin films deposited by Spray Pyrolysis technique for possible applications in solar cells DE Vazquez-Valerdi, JA Luna-Lopez, N Abundiz-Cisneros, G Juarez-Diaz Journal Renewable Energy 6 (17), 8-14, 2022 | | 2022 |
| Optimization of SrRuO3 bottom electrodes fabricated by RF magnetron ion sputtering for new generation devices S Sharma, DEV Valerdi, RC Mendoza, RI Yocupicio-Gaxiola, ... Materials Today: Proceedings 47, 1561-1563, 2021 | | 2021 |
| Role of Different Atmospheres During Annealing in Chemical-Solution-Deposition Nio Thin Films Processing M Martínez-Gil, M Rodriguez-Curiel, D Cabrera-German, ... Available at SSRN 4138311, 0 | | |
| MOPM2021-05: DEVELOPMENT OF OPTICAL FILTERS WITH POROUS SILICON DIOXIDE THIN FILMS L Cruz, R Sanginés, N Abundiz, J Águila, R Machorro NATIONAL ORGANIZATION COMMITTEE, 5, 0 | | |
