| Spectral analysis for the generalized least squares phase-shifting algorithms with harmonic robustness S Ordones, M Servin, M Padilla, A Muñoz, JL Flores, I Choque Optics Letters 44 (9), 2358-2361, 2019 | 16 | 2019 |
| Phase-stepping algorithms for synchronous demodulation of nonlinear phase-shifted fringes M Servin, M Padilla, I Choque, S Ordones Optics express 27 (4), 5824-5834, 2019 | 15 | 2019 |
| Suppressing ripple distortions and spurious pistons in phase-shifting interferometry I Choque, M Padilla, M Servin, M Asmad, S Ordones JOSA A 37 (4), 614-620, 2020 | 12 | 2020 |
| Shape defect measurement by fringe projection profilometry and phase-shifting algorithms S Ordones, M Servin, M Padilla, I Choque, JL Flores, A Muñoz Optical Engineering 59 (1), 014107-014107, 2020 | 12 | 2020 |
| Phase measurement of nonuniform phase-shifted interferograms using the frequency transfer function I Choque, M Servin, M Padilla, M Asmad, S Ordones Applied optics 58 (15), 4157-4162, 2019 | 7 | 2019 |
| Tukey’s robust M-estimator for phase demodulation of interferograms with nonuniform shifts S Ordones, M Servin, M Padilla, I Choque, A Muñoz, JL Flores Applied Optics 59 (20), 6224-6230, 2020 | 5 | 2020 |
| Interferometria speckle para evaluar la flexión de una barra de aluminio RA Montalvo, M Asmad, I Choque, G Baldwin Revista mexicana de física E 62 (2), 125-134, 2016 | 2 | 2016 |
| Evaluación de la concavidad de un espejo para telescopio mediante procesamiento de un solo interferograma RA Montalvo, M Tesillo, I Choque, M Asmad Revista de Investigación de Física 18 (1), 1-8, 2015 | 1 | 2015 |
| Interferograms analysis for measuring the thickness of aluminum thin films I Choque, M Asmad, J Miranda, A Quispe Optical Measurement Systems for Industrial Inspection XIII 12618, 520-525, 2023 | | 2023 |
| Surface measurement with vertical super-resolution of aluminum thin films by using phase-shifting interferometry I Choque | | 2021 |
| Windowed generalized phase-shifting algorithms S Ordones, M Servin, M Padilla, I Choque, JL Flores, A Muñoz Interferometry XX 11490, 1149004, 2020 | | 2020 |
| Testing concavity of a telescope mirror by processing of a single interferogram RA Montalvo, M Tesillo, I Choque, M Asmad | | 2015 |
| Testing concavity of a telescope mirror by processing of a single interferogram/Evaluación de la concavidad de un espejo para telescopio mediante procesamiento de un solo … RA Montalvo, M Tesillo, I Choque, M Asmad Revista de investigación de física 18 (1), 2015 | | 2015 |
| Surface Measurement of Aluminum Thin Films by Using Michelson-Type Interferential Microscopy I Choque, M ASMAD, J Miranda, A Quispe Available at SSRN 4605485, 0 | | |
Sotero OrdonesCentro de investigaciones en OpticaVerified email at cio.mx
