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HATİCE KANBUR
HATİCE KANBUR
Dirección de correo verificada de bozok.edu.tr
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The effect of interface states, excess capacitance and series resistance in the Al/SiO2/p-Si Schottky diodes
H Kanbur, Ş Altındal, A Tataroğlu
applied surface science 252 (5), 1732-1738, 2005
1042005
The determination of interface states and series resistance profile of Al/polymer/PEDOT-PSS/ITO heterojunction diode by I–V and C–V methods
R Şahingöz, H Kanbur, M Voigt, C Soykan
Synthetic Metals 158 (17-18), 727-731, 2008
882008
Gaussian distribution of inhomogeneous barrier height in Al/SiO2/p-Si Schottky diodes
DE Yıldız, Ş Altındal, H Kanbur
Journal of Applied Physics 103 (12), 2008
842008
On the energy distribution of interface states and their relaxation time and capture cross section profiles in Al/SiO2/p-Si (MIS) Schottky diodes
Ş Altındal, H Kanbur, İ Yücedağ, A Tataroğlu
Microelectronic engineering 85 (7), 1495-1501, 2008
832008
Current conduction mechanism in Al/p-Si Schottky barrier diodes with native insulator layer at low temperatures
Ş Altındal, H Kanbur, DE Yıldız, M Parlak
Applied surface science 253 (11), 5056-5061, 2007
762007
The barrier height distribution in identically prepared Al/p-Si Schottky diodes with the native interfacial insulator layer (SiO2)
Ş Altındal, H Kanbur, A Tataroğlu, MM Bülbül
Physica B: Condensed Matter 399 (2), 146-154, 2007
592007
ALD TiO2 thin film as dielectric for Al/p-Si Schottky diode
SBK Aydin, DE Yildiz, HK Çavuş, R Şahingöz
Bulletin of Materials Science 37, 1563-1568, 2014
372014
Novel acid mono azo dye compound: Synthesis, characterization, vibrational, optical and theoretical investigations of 2-[(E)-(8-hydroxyquinolin-5-yl)-diazenyl]-4, 5 …
M Saçmacı, HK Çavuş, H Arı, R Şahingöz, T Özpozan
Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy 97, 88-99, 2012
172012
Effects of illumination on IV, CV and G/wV characteristics of Au/n-CdTe Schottky barrier diodes
H Kanbur, Ş Altindal, T Mammadov, Y Şafak
Journal of Optoelectronics and Advanced Materials 13 (5), 713, 2011
162011
Yalıtkan tabakalı Al/p-Si Schottky diyotlarda elektriksel karakteristiklerin sıcaklığa bağlı incelenmesi
H Kanbur
Doktora Tezi, Ankara, 2008
132008
Optical and electrical properties of new organic thin film
HK Çavuş, MM Voigt, R Şahingöz
Journal of Materials Science: Materials in Electronics 24, 4833-4838, 2013
102013
Sur la distribution d'énergie des états d'interface et leur temps de relaxation et de capturer des profils de section transversale en Al/SiO2/Si-p diodes Schottky (MIS)
S Altındal, H Kanbur, I Yücedag, A Tataroglu
Microelectron. Eng 85, 1495-1501, 2008
22008
AC electrical conductivity and dielectric properties of Al/NphAOEMA/PEDOT-PSS/ITO structure at different temperatures
R ŞAHINGÖZ, HK ÇAVUŞ, Ş Altindal
Optoelectronics and Advanced Materials-Rapid Communications 4 (November 2010 …, 2010
12010
On the energy distribution of interface states and their relaxation time and capture cross section profiles in Al/SiO2/p-Si (MIS) Schottky diodes
S Altndal, H Kanbur, I Yucedag, A Tataroglu
Microelectronic Engineering 85 (7), 1495-1501, 2008
12008
Electrical characterization of Al/PTF/PEDOT: PSS/ITO heterojunction structure
HK Çavuş
Journal of Materials Science: Materials in Electronics 26, 5161-5165, 2015
2015
Electrical characterization of Al/PTF/PEDOT:PSS/ITO heterojunction structure
HK Çavuş
2015
Investigation of UV and I–V characteristics of high refractive index polymer thin film for optoelectronic applications
HK Çavuş, M Çavuş, R Şahingöz
Journal of Materials Science: Materials in Electronics 25, 1731-1735, 2014
2014
The dependence of electrical properties of Al/NphAOEMA/PEDOT-PSS/ITO structures on temperature
R ŞAHINGÖZ, HK ÇAVUŞ, Ş Altindal, C Soykan, İ DÖKME
Optoelectronics and Advanced Materials-Rapid Communications 4 (December 2010 …, 2010
2010
Effect of Gamma-ray (60Co) irradiation on the CV and G/W characteristics of Au/n-CdTe Schottky Barrier Diodes (SBDs)
S Yasemin, U Habibe, M Tofig, K Hatice
Fizika (Baku) 16, 2010
2010
On the energy distribution of interface states and their relaxation time and capture cross section profiles in Al/SiO2/p-Si (MIS) Schottky diodes
S Altindal, H Kanbur, I Yücedag, A Tataroglu
MICROELECTRONIC ENGINEERING 85 (7), 1495-1501, 2008
2008
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