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Florian Schmidt
Florian Schmidt
Robert Bosch GmbH Reutlingen, Deutschland
Dirección de correo verificada de de.bosch.com
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Determination of the mean and the homogeneous barrier height of Cu Schottky contacts on heteroepitaxial β‐Ga2O3 thin films grown by pulsed laser deposition
D Splith, S Müller, F Schmidt, H Von Wenckstern, JJ van Rensburg, ...
physica status solidi (a) 211 (1), 40-47, 2014
1302014
Control of the conductivity of Si‐doped β‐Ga2O3 thin films via growth temperature and pressure
S Müller, H von Wenckstern, D Splith, F Schmidt, M Grundmann
physica status solidi (a) 211 (1), 34-39, 2014
1162014
Schottky contacts to In2O3
H von Wenckstern, D Splith, F Schmidt, M Grundmann, O Bierwagen, ...
APL Materials 2 (4), 2014
742014
Continuous composition spread using pulsed-laser deposition with a single segmented target
H von Wenckstern, Z Zhang, F Schmidt, J Lenzner, H Hochmuth, ...
CrystEngComm 15 (46), 10020-10027, 2013
732013
Comparison of Schottky contacts on β-gallium oxide thin films and bulk crystals
S Müller, H von Wenckstern, F Schmidt, D Splith, FL Schein, H Frenzel, ...
Applied Physics Express 8 (12), 121102, 2015
532015
Method of choice for fabrication of high-quality ZnO-based Schottky diodes
S Müller, H von Wenckstern, F Schmidt, D Splith, R Heinhold, M Allen, ...
Journal of Applied Physics 116 (19), 2014
462014
Morphological, structural and electrical investigations on non-polar a-plane ZnO epilayers
S Lautenschlaeger, S Eisermann, MN Hofmann, U Roemer, M Pinnisch, ...
Journal of crystal growth 312 (14), 2078-2082, 2010
392010
pn‐Heterojunction Diodes with n‐Type In2O3
H von Wenckstern, D Splith, S Lanzinger, F Schmidt, S Müller, P Schlupp, ...
Advanced Electronic Materials 1 (4), 1400026, 2015
372015
Method of choice for the fabrication of high-quality β-gallium oxide-based Schottky diodes
S Müller, H von Wenckstern, F Schmidt, D Splith, H Frenzel, ...
Semiconductor Science and Technology 32 (6), 065013, 2017
202017
Eclipse Pulsed Laser Deposition for Damage‐Free Preparation of Transparent ZnO Electrodes on Top of Organic Solar Cells
S Schubert, F Schmidt, H von Wenckstern, M Grundmann, K Leo, ...
Advanced Functional Materials 25 (27), 4321-4327, 2015
202015
Optical and defect properties of hydrothermal ZnO with low lithium contamination
R Heinhold, HS Kim, F Schmidt, H Von Wenckstern, M Grundmann, ...
Applied Physics Letters 101 (6), 2012
202012
Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals
F Schmidt, S Müller, H Von Wenckstern, CP Dietrich, R Heinhold, HS Kim, ...
Applied Physics Letters 103 (6), 2013
152013
Low rate deep level transient spectroscopy-a powerful tool for defect characterization in wide bandgap semiconductors
F Schmidt, H von Wenckstern, O Breitenstein, R Pickenhain, ...
Solid-state electronics 92, 40-46, 2014
132014
On the radiation hardness of (Mg, Zn) O thin films grown by pulsed-laser deposition
F Schmidt, H Wenckstern, D Spemann, M Grundmann
Applied Physics Letters 101 (1), 2012
122012
Defects in a nitrogen‐implanted ZnO thin film
M Schmidt, M Ellguth, F Schmidt, T Lüder, H Wenckstern, R Pickenhain, ...
physica status solidi (b) 247 (5), 1220-1226, 2010
82010
Electronic defects in In2O3 and In2O3:Mg thin films on r‐plane sapphire
F Schmidt, D Splith, S Müller, H von Wenckstern, M Grundmann
physica status solidi (b) 252 (10), 2304-2308, 2015
72015
Nickel‐related defects in ZnO–A deep‐level transient spectroscopy and photo‐capacitance study
M Schmidt, K Brachwitz, F Schmidt, M Ellguth, H von Wenckstern, ...
physica status solidi (b) 248 (8), 1949-1955, 2011
72011
A continuous composition spread approach towards monolithic, wavelength-selective multichannel UV-photo-detector arrays
H von Wenckstern, Z Zhang, J Lenzner, F Schmidt, M Grundmann
MRS Online Proceedings Library (OPL) 1633, 123-129, 2014
62014
Aluminium‐and gallium‐doped homoepitaxial ZnO thin films: Strain‐engineering and electrical performance
M Lorenz, T Weiss, F Schmidt, H von Wenckstern, M Grundmann
physica status solidi (a) 212 (7), 1440-1447, 2015
42015
Impact of strain on electronic defects in (Mg, Zn) O thin films
F Schmidt, S Müller, H von Wenckstern, G Benndorf, R Pickenhain, ...
Journal of Applied Physics 116 (10), 2014
32014
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Artículos 1–20