Determination of the mean and the homogeneous barrier height of Cu Schottky contacts on heteroepitaxial β‐Ga2O3 thin films grown by pulsed laser deposition D Splith, S Müller, F Schmidt, H Von Wenckstern, JJ van Rensburg, ... physica status solidi (a) 211 (1), 40-47, 2014 | 130 | 2014 |
Control of the conductivity of Si‐doped β‐Ga2O3 thin films via growth temperature and pressure S Müller, H von Wenckstern, D Splith, F Schmidt, M Grundmann physica status solidi (a) 211 (1), 34-39, 2014 | 116 | 2014 |
Schottky contacts to In2O3 H von Wenckstern, D Splith, F Schmidt, M Grundmann, O Bierwagen, ... APL Materials 2 (4), 2014 | 74 | 2014 |
Continuous composition spread using pulsed-laser deposition with a single segmented target H von Wenckstern, Z Zhang, F Schmidt, J Lenzner, H Hochmuth, ... CrystEngComm 15 (46), 10020-10027, 2013 | 73 | 2013 |
Comparison of Schottky contacts on β-gallium oxide thin films and bulk crystals S Müller, H von Wenckstern, F Schmidt, D Splith, FL Schein, H Frenzel, ... Applied Physics Express 8 (12), 121102, 2015 | 53 | 2015 |
Method of choice for fabrication of high-quality ZnO-based Schottky diodes S Müller, H von Wenckstern, F Schmidt, D Splith, R Heinhold, M Allen, ... Journal of Applied Physics 116 (19), 2014 | 46 | 2014 |
Morphological, structural and electrical investigations on non-polar a-plane ZnO epilayers S Lautenschlaeger, S Eisermann, MN Hofmann, U Roemer, M Pinnisch, ... Journal of crystal growth 312 (14), 2078-2082, 2010 | 39 | 2010 |
pn‐Heterojunction Diodes with n‐Type In2O3 H von Wenckstern, D Splith, S Lanzinger, F Schmidt, S Müller, P Schlupp, ... Advanced Electronic Materials 1 (4), 1400026, 2015 | 37 | 2015 |
Method of choice for the fabrication of high-quality β-gallium oxide-based Schottky diodes S Müller, H von Wenckstern, F Schmidt, D Splith, H Frenzel, ... Semiconductor Science and Technology 32 (6), 065013, 2017 | 20 | 2017 |
Eclipse Pulsed Laser Deposition for Damage‐Free Preparation of Transparent ZnO Electrodes on Top of Organic Solar Cells S Schubert, F Schmidt, H von Wenckstern, M Grundmann, K Leo, ... Advanced Functional Materials 25 (27), 4321-4327, 2015 | 20 | 2015 |
Optical and defect properties of hydrothermal ZnO with low lithium contamination R Heinhold, HS Kim, F Schmidt, H Von Wenckstern, M Grundmann, ... Applied Physics Letters 101 (6), 2012 | 20 | 2012 |
Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals F Schmidt, S Müller, H Von Wenckstern, CP Dietrich, R Heinhold, HS Kim, ... Applied Physics Letters 103 (6), 2013 | 15 | 2013 |
Low rate deep level transient spectroscopy-a powerful tool for defect characterization in wide bandgap semiconductors F Schmidt, H von Wenckstern, O Breitenstein, R Pickenhain, ... Solid-state electronics 92, 40-46, 2014 | 13 | 2014 |
On the radiation hardness of (Mg, Zn) O thin films grown by pulsed-laser deposition F Schmidt, H Wenckstern, D Spemann, M Grundmann Applied Physics Letters 101 (1), 2012 | 12 | 2012 |
Defects in a nitrogen‐implanted ZnO thin film M Schmidt, M Ellguth, F Schmidt, T Lüder, H Wenckstern, R Pickenhain, ... physica status solidi (b) 247 (5), 1220-1226, 2010 | 8 | 2010 |
Electronic defects in In2O3 and In2O3:Mg thin films on r‐plane sapphire F Schmidt, D Splith, S Müller, H von Wenckstern, M Grundmann physica status solidi (b) 252 (10), 2304-2308, 2015 | 7 | 2015 |
Nickel‐related defects in ZnO–A deep‐level transient spectroscopy and photo‐capacitance study M Schmidt, K Brachwitz, F Schmidt, M Ellguth, H von Wenckstern, ... physica status solidi (b) 248 (8), 1949-1955, 2011 | 7 | 2011 |
A continuous composition spread approach towards monolithic, wavelength-selective multichannel UV-photo-detector arrays H von Wenckstern, Z Zhang, J Lenzner, F Schmidt, M Grundmann MRS Online Proceedings Library (OPL) 1633, 123-129, 2014 | 6 | 2014 |
Aluminium‐and gallium‐doped homoepitaxial ZnO thin films: Strain‐engineering and electrical performance M Lorenz, T Weiss, F Schmidt, H von Wenckstern, M Grundmann physica status solidi (a) 212 (7), 1440-1447, 2015 | 4 | 2015 |
Impact of strain on electronic defects in (Mg, Zn) O thin films F Schmidt, S Müller, H von Wenckstern, G Benndorf, R Pickenhain, ... Journal of Applied Physics 116 (10), 2014 | 3 | 2014 |